The most important features of
WAFERMAP for Windows are listed below:
- Input of up to 32768 values and according site coordinates
- Import functions for data from metrology tools
- such as Filmetrics or Eichhorn and Hausmann E+H,
- which directly write the WAFERMAP format (e.g. ISIS Optronics), and
-which write pure ASCII data
- Export of pictures in different formats
- Export of the analysis of complete data sets into HTML format
- Configurable 1D- (line scan), 2D- (Contour and colored), 3D (solid or wire frame), 3D bar chart, and 2D value plots
- Statistical analysis (Histogram, calculation of mean, Standard Deviation, etc.)
- Sigma range maps
- File compare operations (add, subtract, multiply, divide, or average) of two different maps
- Global operations (add, subtract, divide, square, square root, etc.)
- 1st and 2nd derivative of a map
- Shift (X and Y direction) and rotation of grids
- Mirroring of maps
- Automatic generation of circular patterns (9, 25, 49, 81, 121, 169, 225, up to 1521 sites)
- Automatic generation of Cartesian patterns based on X and Y resolution
- Definition of any site pattern using a graphic editor
- Cut and Paste functionality for coordinates and measurement values e.g. from Excel
- Statistical Process Control tools including:
- Trend charts sortable by any criterion (date & time, mean, max, min, std. dev., etc.)
- X-Y-Plots of trend parameters
- Trend Lists sortable by any criterion (date & time, mean, max, min, std. dev., etc.)
- Browser
- Global Statistics ("All points, all measurements")
- Inter-application communication via DCOM (ActiveX server)
- Multiple files can be loaded and open simultaneously
- Multiple views of a single file can be selected and displayed simultaneously
- Multiple views can be printed in b/w or color on a single sheet, printouts are configurable
- Extensive on-line help and HTML based user manual.
Click here to visit Boin GmbH and to download demo software versions
We would like to give you information on special applications, which are possible with the functionality of WAFERMAP and PANELMAP. Additionally, we would like to encourage you to let us know special applications you are doing with WAFERMAP and PANELMAP. In this case, we could publish a joint Application Note, if you are interested. Also, in case you would like to use our products for a special application and are not sure how to do it, please contact us.
